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Atomic-force microscopy
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91	application note Lise-Meitner-Straße 6, DUlm, Germany Tel. +700, Fax. +70200 www.witec.de, Raman, PL & AFM measurements on laser lithographically written structures in Add to Reading List Source URL: www.witec.de Language: English - Date: 2014-10-14 09:44:01 Optics Raman spectroscopy Near-field scanning optical microscope Microscopy Laser Atomic force microscopy Microscope Science Scanning probe microscopy Scientific method
92	AFM and Confocal Fluorescence Microscopy can be Complementary Tools Since its invention in 1986, atomic force microscopy (AFM) has been used to visualize the surface topographies of various samples by using the tipsample Add to Reading List Source URL: www.nanowerk.com Language: English - Date: 2011-11-12 18:00:00 Microscopy Spectroscopy Fluorescence Microscopes Molecular biology Fluorescence microscope Fluorescence correlation spectroscopy Johan Sebastiaan Ploem Confocal laser scanning microscopy Chemistry Science Scientific method
93	Nanotechnology Solutions Partner Park Systems Singapore. 33, Ubi Avenue 3, #07-47 Vertex Tower A SingaporeTel: +Mobile: +www.parkAFM.com © 2011 Park Systems Corp. All rights reserved. Add to Reading List Source URL: www.nanowerk.com Language: English - Date: 2011-11-12 18:00:00 Intermolecular forces Chemistry Atomic force microscopy Park Systems Nanotechnology Nanometrology Image scanner Scanning electron microscope Vibrational analysis with scanning probe microscopy Scientific method Science Scanning probe microscopy
94	application note Lise-Meitner-Straße 6, DUlm, Germany Tel. +, Fax. +www.witec.de, Imaging of Carbon Nanotubes Add to Reading List Source URL: www.witec.de Language: English - Date: 2014-10-14 09:51:53 Raman spectroscopy Laboratory techniques Atomic force microscopy Microscopy 10 micrometres Carbon nanotubes Optical properties of carbon nanotubes Carbon nanotubes in medicine Scientific method Science Chemistry
95	Soft Matter World Newsletter May \| 2011 \| Issue 29 Dear Soft Matter Colleagues, Add to Reading List Source URL: www.softmatterworld.org Language: English - Date: 2015-01-07 17:34:49 Science Atomic force microscopy Microscopy Materials science Crystal Liquid crystal Beta-lactoglobulin Liquid Matter Chemistry Soft matter
96	application note Lise-Meitner-Straße 6, DUlm, Germany Tel. +700, Fax. +70200 www.witec.de, Stress in Si Add to Reading List Source URL: www.witec.de Language: English - Date: 2014-12-05 08:57:45 Semiconductors Silicon-germanium Atomic force microscopy Strain engineering Chemistry Silicon Raman spectroscopy
97	5-6 October 2011 in Berlin 10th International Symposium on Scanning Probe Microscopy & Optical Tweezers in Life Sciences A forum for applications in scanning probe and optical tweezers technologies Add to Reading List Source URL: www.nanobioviews.net Language: English - Date: 2011-09-28 12:35:18 Biology Spectroscopy Condensed matter physics Nanotechnology Canton of Neuchâtel Atomic force microscopy NanoWorld Force spectroscopy Scanning tunneling microscope Science Scanning probe microscopy Chemistry
98	Nanotechnology Solutions Partner Park Systems Singapore. 33, Ubi Avenue 3, #07-47 Vertex Tower A SingaporeTel: +Mobile: +www.parkAFM.com © 2011 Park Systems Corp. All rights reserved. Add to Reading List Source URL: www.nanowerk.com Language: English - Date: 2011-11-12 18:00:00 Chemistry Nanotechnology Park Systems Intermolecular forces Nanometrology Scanning electron microscope Spectroscopy Atomic force microscopy Vibrational analysis with scanning probe microscopy Scientific method Science Scanning probe microscopy
99	application note Lise-Meitner-Str. 6, DUlm, Germany Tel. +700, Fax. +70200 www.witec.de, Scanning Near-field Optical Microscopy - Human Chromosomes in Add to Reading List Source URL: www.witec.de Language: English - Date: 2014-12-05 08:49:41 Laboratory techniques Genetics Cell cycle Metaphase Chromosome Fluorescence in situ hybridization Microscope Atomic force microscopy Fluorescence microscope Biology Cytogenetics Microscopy
100	Photon Factory Activity Report 2008 #26 Part BSurface and Interface 7C/2007G667 Electrostatic force Cancelation in the XANAM measurement Add to Reading List Source URL: pfwww.kek.jp Language: English - Date: 2010-01-05 10:36:04 Spectroscopy Intermolecular forces Atomic force microscopy X-ray Scientific method Science Scanning probe microscopy

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